AFM Imaging and Beyond : A Practical Guide to AFM Modes

AFM Imaging and Beyond : A Practical Guide to AFM Modes

Wednesday 7 September 2022, 4am NZST, 2am AEST Midnight AWST (6 Sept)

Atomic force microscopy is an umbrella term comprising dozens of complementary “modes” of operation. These different modes can not only characterise nanoscale topographic features but also nanoelectrical, nanomechanical, and nanochemical properties of samples. In this webinar, Bruker will look at the ever growing suite of AFM modes and highlight some of the most frequently used ones. They will cover case studies in hot topics, such as battery, semiconductor, and 2D materials, and demonstrate how the use of multiple AFM modes can provide a better understanding of materials at the nanoscale than one mode alone. Read more on Bruker's website.

Webinar Speakers:

Ian Armstrong, Samples Applications Manager - North America, Bruker
Ravi Chintala, Applications Scientist, Bruker
John Thornton, Applications Engineer, Bruker
Senli Guo, Sales Applications Engineer, Bruker
Peter Dewolf, WW Application Director, Bruker