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Webinar : High Speed AFM Fundamentals and Integration with Advanced Optical Techniques

Date: Friday 22 March 2024
Time: 5am NZDT, 3am AEST, 12am Midnight AWST
 


 

Join us and our special guest speaker Dr. George Heath, University of Leeds, UK, for this virtual workshop on high-speed atomic force microscopy (AFM). The webinar will focus on the fundamental principles of the technique, relevant applications, and its integration with advanced optical microscopy.
 

Dr. Heath will speak about his work using the NanoRacer high-speed atomic force microscope to study protein dynamics and will present methods that can increase the temporal and spatial resolution of AFM to the 10 microsecond and sub-nm level. The webinar will provide an overview of the latest developments in high-speed AFM and will include a demonstration on the NanoWizard ULTRA Speed 3 BioAFM, live from our laboratories in Berlin, Germany.

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Webinar : Demystifying Time-Resolved Camera Technologies

Date: Friday 1 March 2024
Time: 5:00am NZDT, 3:00am AEDT, Midnight AWST
 


 

Electron multiplying CCD (EMCCD) and intensified CCD / sCMOS (iCCD / isCMOS) cameras are capable of high temporal resolution optical measurements with single-photon sensitivity. They are tremendously useful for studying combustion, plasma evolution and quantum optics among other applications. Getting the most from these cameras requires a detailed understanding how they work.

 

Join us for a 4-part tutorial on time-resolved detector technologies, comparing the capabilities of different sensor and camera technologies, and a step-by-step tour through how they make measurements, their strengths and limitations. We will break down some example applications, and provide a venue for discussion of experimental challenges with our applications staff. Focus will be on the Andor iXon and iStar cameras, but the concepts will be generally applicable.

 

 

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Nanomechanical Testing Webinar

Learn about nanoindentation-based methods to improve thermomechanical design of integrated structures
 

Date: Thursday 7 March 2024
Time: 6:00am NZDT, 4:00am AEDT, 1:00am AWST
 


If you are not a night owl, register, and you will receive a recording after the event :)


An increasing number of material classes and complex geometries are found in integrated structures for semiconductor devices, elevating the importance of considering thermomechanical integrity to ensure optimal performance, reliability, and yield. Using nanoindentation-based characterisation methods is a valuable way to understand thermomechanical integrity.

 

During this free webinar, our guest speaker, Dr. Kris Vanstreels from imec, will discuss several nanoindentation based approaches will be demonstrated that can be used to study the thermomechanical integrity of thin films and nano-interconnects for semiconductor applications.

 

Webinar Presenter:
Dr. Kris Vanstreelse, Researcher, Reliability and Modeling Group, imec

Nanomechanical Test
Systems
Nanomechanical Instruments
for SEM/TEM
Nanomechanical
Metrology Tools

 

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Webinar : Thermomechanical Integrity of Thin Films and Non-Interconnects

Date: Thursday 7 March 2024
Time: 3:30AM ACDT
 


 

If you are not a night owl, register, and you will receive copy of the recorded webinar after the event :)


An increasing number of material classes and complex geometries are found in integrated structures for semiconductor devices, elevating the importance of considering thermomechanical integrity to ensure optimal performance, reliability, and yield. Using nanoindentation-based characterisation methods is a valuable way to understand thermomechanical integrity.
 

During this free webinar, our guest speaker, Dr. Kris Vanstreels from imec, will discuss several nanoindentation based approaches will be demonstrated that can be used to study the thermomechanical integrity of thin films and nano-interconnects for semiconductor applications.
 

Webinar Presenter
Dr. Kris Vanstreelse
Researcher
Reliability and Modeling Group, imec

Featured Technologies:
Nanomechanical Test Systems
Nanomechanical Instruments for SEM/TEM
Nanomechanical Metrology Tools

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Andor Webinar : Observing Hear-Earth Asteroids (NEA's)

Date: 17 November 2023

Time: 5am NZDT  :  3am AEDT  :  Midnight AWST


 

If you are not a night owl, register, and you will receive copy of the recorded webinar after the event :)

 

In this webinar, Dr. Nicolas Erasmus, Instrumentation Scientist and Astronomer will discuss the follow-up characterisation of near-Earth asteroids (NEAs) using telescopes located in Sutherland, South Africa. He will mainly focus on the DART and IAWN campaigns he's been involved in, where our telescopes equipped with Andor cameras were used to observe the DART spacecraft's impact with the Didymos system, and the planetary defence exercise on asteroids Apophis and 2023 DZ2. Dr. Nicolas Erasmus will also show how they have developed a system that is capable of performing complete autonomous observation of asteroids, a requirement for rapid same-night follow-up campaigns of newly discovered and potentially dangerous NEAs.

 

Dr. Nicolas Erasmus is employed as an Instrumentation Scientist and Astronomer at the South African Astronomical Observatory (SAAO) where his research is in Solar System Science, specifically main-belt and near-Earth asteroids. Nicolas is also involved in astronomical instrumentation development and commissioning for various telescopes and instruments operated by the SAAO in Sutherland. Recently a new asteroid hunting telescope (ATLAS) designed and operated by the University of Hawaii and funded by NASA has been installed in Sutherland, for which Nicolas is the South African lead.

 

Learning Objectives:

• What are near-Earth asteroids (NEAs) and why it is important to study them

• What equipment is best suited for observing NEAs

• Using Andor's SDK to perform robotic and automated observations

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