Webinars
Webinar : AFM Probes from Fabrication to Functionality
Date: Friday 9 May 2025
Time: 3am NZST | 1am AEST | 11pm AWST (8 May)
Bruker, a leader in AFM technology, manufactures a diverse range of AFM probes designed to meet the needs of various research and industrial applications. In this webinar, Bruker AFM probe experts will describe the intricate fabrication process of Bruker's AFM probes and highlight the probes’ unique features, applications, and benefits.
Join us on a journey through the probe fabrication process at Bruker's state‑of‑the‑art facility in Camarillo, CA—where we turn raw material into packaged probes. We will showcase some exemplary probes at different levels of fabrication complexity:
- Silicon probes, such as RTESP‑300 for tapping mode in air on hard materials
- Reflex-coated probes, such as SCANASYST‑FLUID for imaging biological samples in fluid
- Probes with an added tip‑side coating, such as SCM‑PIT‑V2 for electrical modes
- Sharpened silicon-tip probes, such as SAA‑HPI‑SS for ultrahigh‑resolution imaging
- High aspect ratio probes using alternate tip processing methods, such as FIB2‑100A for depth metrology
- Probes with defined shapes deposited using EBD, such as PFQNM‑LC‑V2 for mechanical testing
By the end of the webinar, you will understand the probe manufacturing process and be equipped to make informed decisions for your applications. Whether experienced or new to AFM, this session will offer valuable insights and practical knowledge to enhance your use of AFM probes.
Register now and take your AFM research to the next level with Bruker's state‑of‑the‑art probes!
Speaker : Ian Armstrong, Ph.D. Senior Product Business Manager, AFM Probes, Bruker
Read MoreWebinar : Dose-fractionated EELS spectrum image acquisition with direct detection cameras
Date: Friday 9 May 2025
Time: 4am NZST | 2am AEST | 12 Midnight AWST
If you are not a night owl, register and the recording will be emailed to you
In this electron energy loss spectroscopy (EELS) webinar, we demonstrate the capabilities of Gatan electron counting cameras, and eaSI™ technology, which together enable SI data capture at rates of up to 9,000 pixels/s. The near-zero read noise afforded by these cameras enables these ultra-high spectral rates to be utilised effectively, meaning a multi-frame acquisition approach is typically highly advantageous for all experimental workflows. Large field of view single SI passes can be acquired in just a few seconds, which gives the benefits of reduced dose rate data capture and high-frequency drift correction. Compromised data can be discarded post-acquisition, allowing “dose tuning” to be performed after the fact – ideal when you don’t know the critical damage dose ahead of time for total-dose sensitive samples.
A broad range of application examples using this methodology are presented, including elemental mapping in frozen cell sections (STEM cryo-EELS), electron energy loss near-edge structure (ELNES) mapping of transition metal K-edges (ultra-high energy-loss EELS), as well as atomic resolution EELS mapping of beam-sensitive oxides at low temperature (HR-STEM, Cryo-EELS).
Presenter: Liam Spillane, Analytical Application Scientist, Gatan Inc
Read MoreWebinar : Overview of Stylus Profiling and its Applications (in our time zone!)
Date : Tuesday 11 March 2025
Time : 2pm NZDT | 12 midday AEDT | 9am AWST
In this webinar, we will explore how stylus profilers can characterise a diverse range of materials, particularly in microelectronics and semiconductor applications. Additionally, we will introduce Bruker’s new 11th generation Dektak ProTM Stylus Profiler, providing even more enhanced operability, reliability, and measurement accuracy. Presented by Christian Gow.
The new Dektak ProTM stylus profilometer is the next-generation profiler in the industry-leading Dektak® product line. Incorporating over 55 years of innovation, the new benchtop system provides an expanded measurement area up to 200 mm of full-sample access for semiconductor applications, as well as improved productivity with improved user experience and measurement accuracy. Dektak Pro incorporates advancements that solidify the brand as the world's most advanced stylus profiler suitable for R&D, process development and QA/QC present and future needs across a range of industrial and research markets.
Read MoreWebinar : How to Measure High Resistance
Date: Friday 14 March 2024
Time: 3am NZDT | 1am AEDT | 10pm AWST (13 Mar)
Join us for another informative webinar. In this session, we will focus on the best practices for taking high resistance measurements. Presented by Noah Faust, Lake Shore Cryotronics Electrical Development Engineer, this comprehensive webinar is designed for beginners and those with an intermediate knowledge of measuring high resistance.
In this webinar, we will:
- Show a demonstration of measuring high resistance
- Discuss techniques and best practices for high resistance measurements
- Talk about parasitic capacitance and leakage
At the end, we will then have a Q&A period with Jason Chonko, Senior Presales Applications Engineer, and David Daughton, Senior Applications Scientist Manager, answering questions. See you there!
Read MoreWebinar : Getting the Most out of your Data OIM Analysis 9
Date: Thursday 27 February 2025
Time: 4am NZDT | 2am AEDT | 11pm AEST (26 Feb)
If you are not a night owl, resiter your interest and the recording will be sent to you after the event.
For electron backscatter diffraction (EBSD) users, typical measurement results consist of maps and charts displaying the microstructure of the sample. In many cases, these may simply be generic maps like inverse pole figure (IPF) and image quality (IQ) maps, which can easily be generated with a single mouse click. In addition to these basic analysis options, the EDAX OIM Analysis™ software offers an extensive range of analytical tools to quantify many of your materials’ microstructure components. Customisation of your analyses allows targeted and highly detailed analysis of specific features of the microstructure.
To better lead users through all the capabilities, OIM Analysis 9.1 introduces a new ribbon bar layout that combines easy access to the basic analysis tools with powerful customisation capabilities using templates. This webinar will guide you through the workflow and capabilities of OIM Analysis 9.1 from basic data analysis to automatic reporting.
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