Webinars
Reverse Tip Sample (RTS) Scanning Probe Microscopy
Date: Wednesday 19 June 2024
Time: 3am NZST, 1am AEST, 11am AWST
If you are not a night owl register for the webinar and you will receive a copy after the event :)
Our guest speakers for this webinar developed Reverse Tip Sample (RTS) Scanning Probe Microscopy (SPM) to overcome the single-tip barrier of traditional SPM. By placing the sample on a tipless cantilever and the tip on the sample stage, RTS SPM essentially flips the conventional tip-sample positions.
The standout feature of this arrangement is the ability to change tips seamlessly, greatly boosting data collection efficiency in application spaces requiring frequent tip replacements. During operations in RTS configuration, the cantilever-mounted sample scans one of thousands of tips present on the probe chip. When a tip wears out, the operator repositions the cantilever onto an adjacent fresh tip, which takes mere seconds.
After a comprehensive introduction of the RTS SPM concept, this webinar will further discuss:
- Nanofabrication of probe chips and a dry etching process for fabricating high-quality Si probe chips, which features a novel tip sharpening step. The application of metal and diamond coatings on these Si probe chips will also be covered.
- Sample preparation, including dependable workflows developed for routinely preparing RTS SPM samples by focused ion beam (FIB) and FIB-less approaches. These time-efficient procedures yield RTS samples with excellent electrical contacts and mechanical stability.
- Measurements and applications of RTS SPM, such as statistical multi-tip studies, RTS Scalpel SPM, electrical tomography, and more.
Webinar Speakers:
Nemanja Peric, Ph.D., SPM Researcher, imec, Belgium
Pieter Lagrain, Engineer, imec, Belgium
Peter De Wolf, Ph.D., Senior Directory Technology & Application Development AFM, Bruker
Webinar : In-situ and 4D STEM Analysis Using the Gatan Clearview Camera
Date: Thursday 23 May 2024
Time: 3am NZST, 1am AEST, 11pm AWST (Wed 22 May)
The development of new direct electron detection as well as low-noise, high-speed CMOS cameras has enabled an entirely new realm of analytical (scanning) transmission electron microscopy, including 4D STEM and in-situ videography. In this webinar, we will discuss the integration of a ClearView camera into the JEOL ARM200CF at the University of Illinois – Chicago for atomic-resolution, in-situ, and 4D STEM analysis over a range of acceleration voltages and imaging conditions. Specifically, we will highlight some recent results, including the in-situ transformation of Mg(Mn,Cr)2O4, phase analysis in complex oxide thin films, and electrochemistry measurements using an in-situ liquid-cell at elevated temperatures. Imaging with the ClearView camera is combined with high-resolution EELS measurements using the GIF Continuum.
Presenter:
Robert F. Klie, Ph.D., FMSA
Professor and Head of Department, Department of Physics, University of Illinois Chicago
Webinar : Exploring the Future of Nanomechanical Testing with Bruker's Hysitron TI 990 TriboIndenter
Day : Friday 10 May 2024
Time : 3am NZST, 1am AEST, 11pm AWST (Thurs 9th)
If you are not a night owl register for the webinar and you will receive a copy after the event :)
Learn about Bruker’s latest and most advanced nanomechanical and nanotribological test system, the Hysitron TI 990 TriboIndenter. Building upon a 25-year TriboIndenter legacy, the TI 990 has been completely redesigned from the ground up to deliver new levels of sample throughput, measurement control, testing flexibility, measurement reliability and performance, and ease-of-use. With an all-new system architecture and advanced testing modes, the TI 990 is set to redefine the landscape of nanomechanical and nanotribological testing.
Join us to find out:
- What is new about the TI 990 system architecture?
- What advancements are integrated into the new nanoDMA IV and XPM II?
- How is the new Performech III controller different?
- What does the redesigned TriboScan 12 software look like?
The webinar will also include a demonstration of the Hysitron TI 990 TriboIndenter.
Webinar Speakers:
David Wodnick, Bruker Nanosurfaces and Metrology
Radhika Lazminarayana, Bruker Nanosurfaces and Metrology
Webiner : Understanding Raman Spectroscopy
Date: Friday 10th May, 2024
Time: 3:00am NZST | 1:00am AEST | 11:00pm AWST (Thurs 9th)
Speaker: Adam Wise
If you are not a night owl register for the webinar and you will receive a copy after the event :)
A short introduction to Raman spectroscopy, aimed at those interested in integrating Raman measurements to their experiments. We will review what information can be revealed by Raman spectroscopy, fundamental limitations, and typical experimental setups in the context of developments in instrumentation over the last few decades.
Some common applications for Raman spectroscopy will be explored, including chemical identification. A brief and practical overview will be given of some Raman measurement modalities, including resonance Raman, SERS, TERS, mapping, and widefield Raman imaging. We will contrast Raman spectroscopy to its more popular vibrational cousin, infrared absorption.
Learning Objectives
- What information content a Raman spectrum contains. What can be trivially learned from examination of a spectrum, and further what small changes in e.g. peak energies can imply. What’s so special about the so-called “fingerprint region”?
- The minimum experimental requirements for measuring Raman spectra, as well as some specialised variations used for more niche applications.
- In what situations Raman spectroscopy can likely be used, and alternatively, when measurement of Raman spectra is likely impossible due to the fundamental limitations of the technique.
Webinar : Explore the World of BioAFM with Bruker's Experts
Date: Friday 19 April 2024
Time: 5am NZST, 3am AEST, 1am AWST
If you are not a night owl register for the webinar and you will receive a copy after the event :)
Are you looking to dive deeper into the capabilities of your BioAFM? Do you want to learn about the latest advancements in the field? Are you ready to enhance your experimental skills with practical tips and advanced techniques? Then this is the place for you! Whether you’re a seasoned user or new to the field, this is the perfect opportunity to get YOUR questions answered. Join us on April 18, 2024 to engage directly with Bruker’s specialists in a live, user-driven Q&A session and case-based discussion.
Webinar Speakers
Yi Wei, Ph.D. Applications Scientist, Bruker
Ming Ye, Ph.D. Applications Scientist, Bruker
