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AFM-based Nanoscale DMA

The development of heterogeneous materials like polymer composites, blends and multilayers are of considerable importance in the chemicals industry. Bulk viscoelastic measurements are routine in establishing structure-property relationship for these materials. However, materials R&D often produces composites that contain nano-sized portions that do not exist in the bulk or that have properties influenced by the proximity of other components. A quantitative means of measuring the viscoelastic properties of such mterials at the nanoscale has been a long-standing and elusive goal for atomic force microscopy (AFM). While AFM has the sensitivity and resolution needed to do the measurement, traditional AFM-based approaches are hampered by difficult calibration, poorly defined measurement frequency, and inadequate modeling of the tip-sample interation.


Now, with the development of the AFM-nDMA mode from Bruker, these pitfalls can be avoided and the frequency and temperature depedence of viscoelastic properties in rheologically relevant ranges can be directly measured with 10nm spatial resolution. Read more or download the application note.

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Webinar : Accelerating Semiconductor Processes Control

Tuesday 17 December

            Auckland (NZDT) : 10:00pm
            Brisbane (AEST) : 7:00pm
            Sydney, Canberra, Melbourne, Hobart (AEDT) : 8:00pm
            Adelaide (ACDT) : 7:30pm
            Perth (AWST) : 5:00pm


Recent advances in 3D Optical Metrology accelerate in-line quality control for both front and back end processes. In this webinar, Bruker present case studies that address improving yield, identifying root cause  failure and driving next generation device development from bare wafer to final packaged device.

Bruker will highlight requirements for advanced telecommunication, compact on-board electronics, and electric vehicles covering metrology needs for denser interconnect networks, finer redistribution layer (RDL), direct wafer to wafer bonding and wafer fan-out packaging.

Front end (FEOL) examples will include:

  • Wafer bin roughness and edge roll-off
  • CMP efficiency full die flatness
  • CD metrology including TSV, deep trench RIE (Bosch process)
  • Epi layer defect quantification in high power devices

Back end (BEOL) and packaging examples will address:

  • Under Bump Metallisation (UBM)
  • Recess defect inspection
  • Full die screening for dense interconnect control

Speaker: Samuel Lesko, Senior Manager for Optical and Tribology Applications, Bruker Nano Surfaces Division

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Bruker Webinar

Wednesday 30 October

            Auckland (NZDT) : 11:00am
            Brisbane (AEST) : 8:00am
            Sydney, Canberra, Melbourne, Hobart (AEDT) : 9:00am
            Adelaide (ACDT) : 8:30am
            Perth (AWST) : 6:00am


This webinar, cohosted by Professor Ken Nakajima (Tokyo Institute of Technology) and Bede Pittenger, Ph.D., (Bruker) will discuss new results obtained with atomic force microscope based dynamic mechanical analysis (AFM-nDMA) on polymeric materials. AFM-nDMA makes possible dynamic modulus determination (storage modulus, loos modulus, and loss tangent) with a wide-frequency range that is directly comparable to bulk DMA, but with the nanometer level resolution of AFM.

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Hysitron TS77 Select Nano Test System

Bruker is pleased to announce the expansion of their Hysitron Nanomechanical Test Instruments product line. The Hysitron TS 77 Select automated benchtop nanomechanical and nanotribological test system provides the highest level of performance, functionality, and accessibility of any benchtop nanoindenter. Built around Bruker's renowned TriboScope capacitive transducer technology, this new test system delivers reliable mechanical and tribological characterisation over nanometer-to-micrometre length scales. The TS Select supports the most prominent testing modes, and is an affordable entry into quantitative nanoindentation, dynamic nanoindentation, nanoscratch, nanowear and high-resolution mechanical property mapping.

For further information please contact us or read more.

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Webinar : Evaluate Surface Coating Mechanical and Frictional Properties

Thursday 27 June 2019


New Zealand (NZST) : 5:30pm
Brisbane/Sydney/Canberra/Melbourne/Hobart (AEST) : 3:30pm
Adelaide (ACST) : 3pm
Perth (AWST) : 1:30pm



In the modern engineering community there is a growing need to reduce friction, wear rate and increase durability of the mechanical components. Traditionally these problems were resolved by changing the bulk materials or by utilising lubrications. The recent development in surface engineering fueled by our understanding of the importance of surface properties on tribology and development of new coating and treatment methods have provided another approach to friction and wear control. From biomedical to optical and from microelectronics to decorative applications, coating now plays a major role. 

In this webinar presented by Bruker Nano Surfaces we investigate the measurement and characterisation of surface coatings and their mechanical properties. Specifically we will look in to characterising the adhesion strength between coating and the substrate and the hardness of the coatings. We will also touch on wear and lifetime characterisation of the coated surfaces.

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