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New Dimension IconIR300 System

Bruker’s new Dimension IconIR300 large-sample nanoIR system provides high-speed, high-accuracy nanoscale characterisation for semiconductor applications, featuring unrivaled capabilities and measurement of samples up to 300mm across. Through its combination of proprietary photothermal IR spectroscopy and nanoscale AFM property mapping capabilities, IconIR300 enables automated wafer inspection and defect identification on the widest range of wafer and photomask samples. The system significantly extends the application of AFM-IR technology to semiconductor industry segments beyond the reach of traditional techniques.


Built on the groundbreaking large-sample architecture of the Dimension IconIR system, IconIR300 provides correlative microscopy and chemical imaging, as well as enhanced resolution and sensitivity. Integrated with automated wafer handling and advanced data collection/analysis software, the system enables greater time- and cost-savings and production efficiency.


Highly accurate, rich, detailed spectra with FTIR correlation, achieving nanometer-level measurement of thin contaminants

A variety of advanced operational modes supporting the measurement of a wide range of samples for both industrial and academic users

Highest performance AFM-IR spectroscopy, the leading nanoIR mode in semiconductor applications

Reliable surface-sensitive chemical measurements for polymeric films


For further information please contact us

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Virtual Workshop : Next-Generation Ferroelectric Materials Research

Thursday 30 June 2022 2am NZST, 12 midnight AEST, 10pm AEST (Wed 29th)


Join us for this virtual workshop on Switching Spectroscopy Piezoresponse Force Microscopy (SS-PFM).

Bruker’s new NanoScope 6 controller technology features:

  • 5x lower noise and 20x faster speed
  • Sampling practically without bit-step limitations
  • More capabilities for advanced mechanical and electrical measurements


An example of this improved AFM-controller performance is the Switching Spectroscopy Piezoresponse Force Microscopy (SS-PFM) mode. SS-PFM enables the highly accurate nanoscale characterisation of the properties of ferroelectric materials. The SS-PFM mode expands upon the standard Piezoresponse Force Microscopy (PFM) by greatly improving the sensitivity and accuracy of measurements.



  • Learn how to characterise advanced properties of ferroelectric materials with SS-PFM mode.
  • Get practical guidance for using SS-PFM to generate a hysteresis loop and characterise properties of ferroelectric materials otherwise inaccessible by PFM modes


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Virtual Workshop : Nanoscale Characterisation of Glass and Ceramic Surfaces

Wednesday 1 June 2022 12 midnight (2 Jun) NZST, 10pm AEST, 8pm AWST

Bruker is dedicated to providing a complete range of high-performance metrology techniques for the nanometre-scale surface characterisation of glass and ceramic products. Join us for this virtual Surface Lab session where we will present a range of characterisation techniques, their features, capabilities, and applications.


Highlights of the workshop:

  • LIVE demos on cutting-edge Bruker instruments
  • Nanoscale Investigation of glass & ceramics: Gorilla glass, float glass, and metallic glass
  • Measurements on silicon coatings
  • Thin Film Analysis


The following techniques will be covered:

Atomic Force Microscopy: For high-resolution, topographical, nanomechanical, nanoelectrical, and nanoelectrochemical characterisation of materials.
Nano-Indentation: Nano-mechanical characterisation using nano-indentation methods
Optical Profilers: For 2D roughness surface characterisation and advanced 3D mapping and measurement of thin film thickness, stress, surface roughness and form



Dr Peter De Wolf
Worldwide Application Director
Dr Mickael Febvre
Application Manager Europe
Dr Ude Hangen
Applications Manager
Dr Vishal Panchal
Application Scientist
Dr Udo Volz
Application Scientist


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BioSoft In-Situ Indenter

Bruker's Hysitron BioSoft is a first-of-its-kind instrument specifically designed for multiscale quantitative mechanical testing of biological materials and soft matter, such as hydrogels. This portable system integrates with existing inverted optical microscopes to perfectly synchronise mechanical and optical characterisation techniques. BioSoft uniquely enables the advanced biomechanical testing capabilities to achieve a comprehensive understanding of biomaterials mechanics.

Characterise a broad range of biological materials:

  • Hydrogels - agarose, contact lenses, mimicking tissues
  • Soft Biological Tissues - skin, brain, cartilage, cornea, veins, heart valves
  • Tissue Engineering - grafts and tissue scafolds

For further information please contact us or read more.

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Webinar : Nanoscope 6 : Benefits of the Added Capability and Performance

With continuous developments over the past more than three decades, atomic force microscopy (AFM) has become an essential characterization technique, enabling the discoveries across a nearly countless array of disciplines and applications due to its unique capability of conveying rich physical and chemical information at nanometer scale. As the leader in the advances of AFM technology since the introduction of the first commercial system in the 1980s, Bruker is proud to release the brand-new Nanoscope 6 controller. With the full-spectrum hardware upgrades, the Nanoscope 6 controller not only boosts the AFM performance, but also provides many new capabilities and features, which could offer scientists new opportunities to obtain richer and finer information on complex samples. 20 times faster data acquisition and processing can capture fine details hidden within the force-distance curves in the popular PeakForce Tapping modes, and it also significantly improves the signal-to-noise ratio in other modes like Tapping mode and Contact Resonance-based modes. Switching Spectroscopy PFM mode offers a full suite to quantify nanoscale switching dynamics in ferroelectrics, from data collection to automatic data analysis. AFM-nDMA provides an accurate and complete solution to access the viscoelastic properties at nanoscale.

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