+61 8 8150 5200

Australia • New Zealand

News

Home News
blog image

Nanomechanical Testing Webinar

Learn about nanoindentation-based methods to improve thermomechanical design of integrated structures
 

Date: Thursday 7 March 2024
Time: 6:00am NZDT, 4:00am AEDT, 1:00am AWST
 


If you are not a night owl, register, and you will receive a recording after the event :)


An increasing number of material classes and complex geometries are found in integrated structures for semiconductor devices, elevating the importance of considering thermomechanical integrity to ensure optimal performance, reliability, and yield. Using nanoindentation-based characterisation methods is a valuable way to understand thermomechanical integrity.

 

During this free webinar, our guest speaker, Dr. Kris Vanstreels from imec, will discuss several nanoindentation based approaches will be demonstrated that can be used to study the thermomechanical integrity of thin films and nano-interconnects for semiconductor applications.

 

Webinar Presenter:
Dr. Kris Vanstreelse, Researcher, Reliability and Modeling Group, imec

Nanomechanical Test
Systems
Nanomechanical Instruments
for SEM/TEM
Nanomechanical
Metrology Tools

 

Read More
blog image

Webinar : Thermomechanical Integrity of Thin Films and Non-Interconnects

Date: Thursday 7 March 2024
Time: 3:30AM ACDT
 


 

If you are not a night owl, register, and you will receive copy of the recorded webinar after the event :)


An increasing number of material classes and complex geometries are found in integrated structures for semiconductor devices, elevating the importance of considering thermomechanical integrity to ensure optimal performance, reliability, and yield. Using nanoindentation-based characterisation methods is a valuable way to understand thermomechanical integrity.
 

During this free webinar, our guest speaker, Dr. Kris Vanstreels from imec, will discuss several nanoindentation based approaches will be demonstrated that can be used to study the thermomechanical integrity of thin films and nano-interconnects for semiconductor applications.
 

Webinar Presenter
Dr. Kris Vanstreelse
Researcher
Reliability and Modeling Group, imec

Featured Technologies:
Nanomechanical Test Systems
Nanomechanical Instruments for SEM/TEM
Nanomechanical Metrology Tools

Read More
blog image

NanoWizard ULTRA Speed 3 BioAFM

Fast automated imaging and seamless integration with advanced optics

 

Introducing the new NanoWizard® ULTRA Speed 3 AFM, a powerful addition to the Bruker BioAFM product family. It marks a milestone in speed, automation, and performance.

 

Advanced automation features and an unprecedented scanning speed of 1,400 lines per second have been combined in one instrument, that can be seamlessly integrated into advanced optical microscopy and super-resolution techniques.

 

Discover best-in-class automation capabilities:

  • Fully automated set-up, alignment, and re-adjustment of system parameters
  • Single-click, automated cantilever and optical image calibration
  • Automated, high pixel density mapping and imaging
  • New DynAsyst feature for automated scan parameter adjustment
  • Fast, automated scanning of challenging, highly corrugated samples

 

For further infromation please contact us or read more.

Read More
blog image

Live Webinar on Tribo iQ Software Applications for Hysitron Nanomechanical Test Instruments

Date: Thursday 16 November 2023

Time: 5am NZDT, 3am AEDT, Midnight AWST

 

 

If you are not a night owl, register, and you will receive copy of the recorded webinar after the event :)
 

Bruker’s Tribo iQ suite of technique-specific software applications deliver comprehensive and streamlined data analyses, from indentation and scratch testing to particle compression and tensile testing. In this webinar, our experts demonstrate the use of Tribo iQ for six different types of analysis. 

 

Bruker experts will discuss numerous Tribo iQ technique-specific applications, from indentation analysis to XPM mapping and statistics. 

 

Dr Ude Hangen, Applications Manager, Advanced viewing and analysis of indenation data
Jasmine Johnson, Applications Scientist, XPM mapping and statistics with small data sets
Dr Jungkyu Lee, Applications and Systems Engineer, Advanced viewing and analysis of scratch data
Dr Jaroslav Lukes, Sales Applictions Scientist, Techniques for analysing soft matter
Radhika Laxminarayana, NRL Development Engineer, Time-temperature superposition of nylon 66
Dr Sanjit Bhowmick, Product Line Manager, In situ stress-strain analysis of silicon micropillars

 

For further information on any of the Hysitron family of nanomechanical instruments please contact Christian Gow.

Read More
blog image

Webinar : Advanced Nanomechanical Analysis using Atomic Force Microscopy

Date: Wednesday 27 September 2023

Time: 3am NZST  |  1am AEST  |  11pm AWST (Thurs 26th)
 


 

Please join us for this live webinar on advanced nanoscale analysis using atomic force microscopy (AFM). AFM is a multiparametric imaging technique and ideal for the nanomechanical characterisation of advanced materials and the quantification of properties, such as friction, elastic modulus, stiffness, adhesion, and viscoelasticity.

 

During this webinar, our experts will answer the following questions:

  • Which AFM modes are used for nanomechanical analysis ?
  • How can you leverage additional tools like machine learning and bulk property analysis ?
  • How can you correlate nanomechanical measurements with AFM-based nanoelectrical and nanomechanical characterisation data ?
  • What details should every user know about experiment setup and data analysis ?

 

Webinar Speakers:

Dr. Peter De Wolf, Director Technology & Application Development, Bruker

Dr. Bede Pittenger, Senior AFM Development Scientist, Bruker
 

If you are not a night owl, register, and you will receive copy of the recorded webinar after the event :)

Read More