Bruker Dimension Edge AFM

The Dimension Edge Atomic Force Microscope (AFM) incorporates Bruker's PeakForce Tapping^TM technology to provide the highest levels of performance, functionality and accessibility in its class. Based on the Dimension Icon® platform, the Edge system has been designed from top to bottom to deliver low drift and low noise necessary to achieve publication-ready data in minutes instead of hours, all at price points well below expectations for such performance.

The Dimension Edge is equipped with proprietary ScanAsyst® automatic image optimisation technology, which enables easier, faster, and more consistent results. Now the most advanced large-sample atomic force microscopy capabilities are available to every facility and user. Designed from top to bottom to deliver the low drift and low noise necessary to achieve publication-ready data in minutes instead of hours, you won't find a more powerful mid-priced AFM.

The Dimension Edge sample stage is not only motorised and programmable for efficient multi-site measurements, but it also lets you fit more types of samples directly under the AFM scanner with less preparation time. The physically open access to the probe-sample junction enables more direct investigation of geometrically challenging device structures, as well as the attachment of electrical connections or other custom experiment accessories.

For further information please contact us or download the datasheet.