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Bruker Innova AFM

Bruker Innova AFM

Bruker Innova AFM

Providing complete AFM capabilities to fit your budget

Bruker NanoSurfaces


The Innova® Atomic Force Microscope (AFM) delivers accurate, high-resolution imaging and a wide range of functionality for advanced research in physical, life, and material sciences. The system has been engineered to provide an unmatched combination of productivity, ease of use, and application flexibility for the most demanding scientific research, all at a moderate cost.

It offers a unique, state-of-the-art closed-loop scan linearisation system that ensures accurate measurements and noise levels approaching those of open-loop operation. Innova delivers atomic resolution with great ease and scans up to 90 microns without the need to change scanner hardware. The integrated, high-resolution colour optics and programmable, motorised Z-stage make finding features and changing tips or samples fast and easy.

High-Resolution System

  • Utilises an innovative design optimised for lowest closed-loop noise and drift
  • Ensures accurate measurements at all scales and in all dimensions
  • Delivers highest resolution results with great ease

Fast Setup for Every Experiment

  • Provide fastest hardware setup via ergonomic open stage and premounted cantilever option
  • Ensures fast and precise region of interest identification with software-controlled high-NA optics
  • Distills decades of AFM expertise into preconfigured software settings
  • Enables seamless operation from survey to atomic resolution

Powerful Research Flexibility

  • Addresses all advanced measurements with full range of SPM modes
  • Customises research with configurable signal access and physical access to tip-sample junction
  • Offers nano-optics with TERS-enabled AFM-Raman integration

For further information please contact us or download the datasheet.



Innova brochure                                                           Read more on Bruker's website