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JEOL NeoScope JCM-7000 Benchtop SEM

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JEOL NeoScope JCM-7000 Benchtop SEM

JEOL NeoScope JCM-7000 Benchtop SEM

4th generation NeoScope is smart, powerful and flexible



This 4th generation Neoscope incorporates advanced technology and functions that make it simple for users at any skill level to obtain outstanding SEM images and elemental analysis results in minutes.  It is equipped with a large chamber, high and low vacuum modes, secondary and backscatter electron detectors, real-time 3D imaging, highly-advanced auto functions and the option to add a fully embedded EDS with real-time, ‘Live’ analysis.

Click to view the movie



  • Zeromag - simplifies navigation and enhances throughput. Provides a seamless transition from an optical (or holder graphic) to SEM image
  • Highly-advanced Auto functions for automatic condition setting and image formation in minutes
  • High resolution (100,000X) and large depth of field
  • High and low vacuum modes for managing a wide variety of samples
  • Large chamber : maximum sample size 80mm (D) x 50mm (H)
  • Advanced functions built-in such as : Automated montage and Live 3D imaging
  • Option: Fully embedded EDS with Live (real-time) analysis
  • Smile ViewTM Lab for integrated management of image and analysis data



  • Zeromag simplifies navigation and enhances throughput
  • With Zeromag, you can navigate from a colour optical image - as you increase the magnification, you transition from the optical to live SEM image automatically
  • Set up large area automated image monatge and stiching; EDS option includes automated montage X-ray map
  • Automatically link SEM image, position, optical image, and EDS data (with EDS option)



With the EDS option, the 6-channel, high sensitivity, solid state backscatter electron detector acquires composition, topographic and shadow (combination of composition and topography) images, and supports live 3D imaging.

Combine the live 3D image with software to create a 3D model and calculate surface texture data including cross-sectional profile, height and surface roughnesss



Utilising the optional EDS, with live elemental analysis, you can:

  • View EDS- spectra in real time as you search for an area of interest
  • Set analysis points, area, map positions and line scans
  • View major elements detected, and automatically display on live EDS window

For further information please contact us or download the datasheet.

    Mode   High-vacuum mode: Secondary electron image
  Backscattered electron image
  (Composition, topographic and shadow. 3D images)
  Low-vacuum mode: Backscattered electron image
  (Composition, topographic and shadow, 3D images)
    Electron gun   Tungsten filament/Wehnelt integrated grid
    Accelarating voltage   3 stages 15kV/10kV/5kV
    Specimen stage   X-Y motor drive stage
  X: 40mm; Y: 40mm
    Maximum specimen size   Diameter 80mm, height 50mm
    Specimen exchange   Draw-out mechanism
    Pixels for image acquisition   640 x 480
  1280 x 960
  2,560 x 1,920
  5,120 x 3,840
    Automated functions   Alignment, focus, stigmator, brightness/contrast
    Measurement functions     Distance between 2 points, angles, line wdith
    File format       BMP, TIFF, JPEG, PNG
    Computer   Desktop PC Windows® 10
    Monitor    24 inch
    Vacuum system   Full-automatic TMP:1, RP:1



NeoScope brochure                                                                        NeoScope flyer


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