Gatan Ilion II System

The Ilion® II broad beam argon milling system is a tabletop tool for producing cross-sections and planar polishing of samples for examination in the scanning electron microscope (SEM) and other instruments. Each Ilion II system is suitable for polishing a wide range of materials, including samples made from multiple elements and alloys with a wide range of mechanical hardness, size and other physical characteristics.

Features:

• Vacuum load-lock and liquid nitrogen cold stage to provide rapid workflows on beam sensitive samples
• Real-time observation of the polishing process including an optical microscope with digital imaging; images can be stored and analyzed with DigitalMicrograph® software from Gatan
• Repeatable results from recipes and operation of the Ilion™ II via a 10" color touch screen interface
• Damage-free surfaces for analytical techniques, such as cathodoluminescence and EBSD, where the signal is generated near the surface

For further information please contact us or download the datasheet.