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Bruker Hysitron PI88 SEM PicoIndenter

Home Products Nanomechanical Testing PicoIndenter Bruker Hysitron PI88 SEM PicoIndenter
Bruker Hysitron PI88 SEM PicoIndenter

Bruker Hysitron PI88 SEM PicoIndenter

Next generation in-situ nanomechanical test instrument

Bruker NanoSurfaces

The Hysitron PI88 SEM PicoIndenter is a comprehensive in-situ nanomechanical test instrument for SEM and FIB/SEM.  Built upon Bruker's leading-edge capacitive transducer technology, the PI88 SEM PicoIndenter gives researchers an advanced instrument with powerful capabilities that delivers extraordinary performance and versatility. The modular design also supports our full suite of testing techniques for future upgradability, now including 800°C heating, scratch testing, 5-axis sample positioning, electrical characterisation, dynamic fatigue testing, and an interchangeable extended range (500mN, 150µm) transducer. 

Designed for Performance and Versatility

The PI88 comes standard with advanced XYZ sample positioning stages which provide greater travel range (>8mm) for accessing more sample area with superior resolution and linearity. These stages also provide the foundation for the various upgrade modules available for the PI88. Coupling the stages with a variable-load frame transducer design featuring user-changeable load cells provides the versatility required to meet evolving research demands.

An Optimised Interface for the SEM

The PI88 mounts easily to the SEM stage without being a permanent fixture in the microscope. The compact design of the instrument allows for maximum stage tilt and minimum working distance for optimal imaging during testing. Through a custom feedthrough, the system connects to Bruker’s Performech® II Advanced Control Module, which boasts an ultra-low noise floor, a 78kHz digital feedback routine, and data acquisition rates up to 39kHz.

For further information please contact us or download the datasheet.

PI-88 datasheet                                           Read more on Hysitron's website