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Bruker ContourX-200 3D Optical Profilometer

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Bruker ContourX-200 3D Optical Profilometer

Bruker ContourX-200 3D Optical Profilometer

Flexible benchtop for surface texture metrology

Bruker NanoSurfaces

 

 

The ContourX family of profilometers utilises numerous Bruker-exclusive WLI technology advances to deliver the industry's most capable benchtop metrology and easiest to use surface measurement software. Available in three benchtop models, the ContourX profilers feature new, robust design and provide a range of capabilities and price points optimised to match individual metrology and budget requirements. New hardware features include an innovative stage design for larger stitching capbilities and a 5MP camera with a 1200 x 1000 measurement array for lower noise, larger field-of-view, and higher lateral resolution.

 

The ContourX-200 Optical Profilometer provides the perfect blend of advanced characterisation, customisable options, and ease of use for best-in-class fast, accurate, and repeatable non-contact 3D surface metrology.

 

Features:

  • Best Z resolution independent of magnification
  • Largest standard field of view
  • High-stability, vibration-tolerant compact design
  • Easy-to-use interface for quick and accurate results
  • Automatoin capabilities to set up routines for measurement and analysis
  • Extensive library of filters and analysis options for roughenss, surface texture, and ctritical dimension

 

The gage-capable, small footprint system offers uncompromised 2D/3D high-resolution measurement capabilities using a larger FOV 5 MP digital camera and new motorised XY stage. ContourX-200 also comes complete with Vision64®, the industry’s most advanced operation and analysis software. New VisionXpress™ provides an even easier to use interface and streamlined capabilities with access to an extensive library of pre-programmed filters and analyses for precision machined surfaces, thick films, semiconductor, ophthalmic, medical device, MEMS and tribology applications. Boasting unmatched Z-axis resolution and accuracy, the ContourX-200 provides all the industry recognised advantages of Bruker’s proprietary white light interferometry (WLI) technology without the limitations of conventional confocal microscopes and competing standard optical profilers.

 

For further information please contact us, download the datasheet, or read about the ContourX-100 or ContourX-500

                                                   

ContourX-200 brochure                                            Read more on Bruker's website