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Edinburgh RM5 Raman Microscope

Edinburgh RM5 Raman Microscope

Edinburgh RM5 Raman Microscope

Compact and fully automated precision Raman

Edinburgh Instruments

 

The RM5 is a compact and fully automated Raman microscope for analytical and research purposes. The truly confocal design of the RM5 is unique to the market and offers uncompromised spectral resolution, spatial resolution and sensitivity.

 

Features:

  • Truly Confocal : with variable slit and multiple position adjustable pinhole for higher image definition, better fluorescence rejection and application optimisation
  • Integrated Narrowband Raman Lasers : up to 3 computercontrolled lasers for ease of use, enhanced stability and reduced footprint
  • 5-Position Grating Turret : for unrivalled spectral resolution of 1.4 cm-1 (FWHM) and optimisation over the full spectral range 50 cm-1 - 4000 cm-1
  • Integrated Detectors : up to 2, including high efficiency CCD, EMCCD and InGaAs arrays for low noise, increased speed, high sensitivity and wide spectral range

The RM5 builds on the expertise of robust and proven building blocks, combined with modern optical design considerations; and a focus on function, precision and speed. The result is a modern Raman microscope that stands alone in both specifications and ease of use.

 

For further information please contact us or download the datasheet.

                                                         

       RM5 datasheet                                                        Read more on Edinburgh's website

 

                                                        

               Blog                                                                  The Anatomy of a Raman Microscope

                                                      

Angle-resolved Polarised                                       Discrimination of Bacteria Species
   Raman Microscopy                                                    Using Raman Microscopy

 

                                                      

Raman Mapping of Layer Number,                            All other application notes
  Strain and Structural Defects
         in Graphene