Nikon Eclipse LVX00N/ND FPD/LSI Inspection Microscope

With improved observation and operation, and environmentally friendlier, these four ECLIPSE models are ideally suited for inspection of large FPD/LSI. Featuring a new improved illumination system, these microscopes provide images with greater contrast, high resolving power and darkfield images three times brighter than before.

Epi-fluorescence observation widens inspection range: Diascopic illumination capability and various observation methods such as brightfield, darkfield, simple polarising and DIC. Epi-fluorescence observation including 365nm UV excitation is also possible.
High Intensity Halogen Illumination: High intensity 12V-50W halogen illuminator (LV-LH50PC) provides greater brightness than that of a 12V-100W halogen illuminator with half the power consumption
Improved DIC Microscopy: Nikon's CFI LU Plan objectives allow the use of multiple observation techniques, including brightfield, darkfield, and Nomarski DIC using a single objective
Designed for Comfort: Incorporating a SEMI-compliant design, controls and knobs are positioned low and close to the operator while the eyepoint is set at the ideal height for comfortable operation
Tilting Eyepiece Tube: The eyepiece tube is of the trinocular tilting type, allowing continuous adjustment of the tilt angle from 0° to 30° for viewing at the optimum eyepoint level
Fixed Position X-Y Fine Movement Controls: The XY fine movement controls remain in the same position, close to the front, for a comfortable viewing posture regardless of the stage position
Motorised Nosepiece with Software Control: The motorised universal nosepiece for the L200N series microscope has improved centricity and is three times more durable than conventional models
CFI60 Optical System: Provide outstandingly clear, sharp images with longer working distances, high numerical aperture (NA) and minimal flare
Vibration Isolation: Applying computer-aided engineering (CAE), Nikon increased the rigidity of the L200 series dramatically, making these microscopes three times less suspectible to floor vibrations

For further information please contact us or download the datasheet.