Bruker FilmTek SE Spectroscopic Ellipsometer

The base model of our "SE" product line, the FilmTek™ SE automated benchtop spectroscopic ellipsometer offers users a streamlined option for quickly and easily collecting highly precise, repeatable measurements on a range of thin and ultra-thin film samples.

The FilmTek SE is a benchtop spectroscopic ellipsometer for single point measurements and can be configured with a manual or automated xy stage. At the click of a button, thousands of wavelengths are simultaneously collected in seconds, and the integrated auto-focus feature eliminates the tedious task of manual sample alignment required by comparable ellipsometers. Our film modeling software and in-house dispersion formula allow for easy data processing, giving accurate and precise real-time results. 

Features:

• Spectroscopic ellipsometry with rotating compensator design (390nm - 950nm)
• Automated stage with autofocus
• Ideal for measuring ultra-thin films (0.03Å repeatability on native oxide)
• Affordable for nearly any budget
• Advanced material modeling software
• Bruker's generalised material model with advanced global optimisation algorithms

For further infromation please contact us or download the datasheet.