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Bruker ContourX-500 3D Optical Profilometer

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Bruker ContourX-500 3D Optical Profilometer

Bruker ContourX-500 3D Optical Profilometer

Fully automated benchtop for 3D metrology

Bruker NanoSurfaces

The ContourX family of profilometers utilises numerous Bruker-exclusive WLI technology advances to deliver the industry's most capable benchtop metrology and easiest to use surface measurement software. Available in three benchtop models, the ContourX profilers feature new, robust design and provide a range of capabilities and price points optimised to match individual metrology and budget requirements. New hardware features include an innovative stage design for larger stitching capbilities and a 5MP camera with a 1200 x 1000 measurement array for lower noise, larger field-of-view, and higher lateral resolution.

The ContourX-500 Optical Profilometer is the world's most comprehensive automated benchtop system for fast, non-contact 3D surface metrology. Incorporating Bruker's proprietary tip/tilt optical head, the system is fully programmable to measure surface features over a range of angles while minimising tracking errors.


  • Industry-best Z resolution independent of magnification
  • Advanced automation configured with encoded XY stage, auto tip/tilt head, and auto intensity
  • Integrated air isolation in a space-efficient footprint
  • Easy-to-use interface for quick and accurate results
  • Wide range of automation features to tailor measurement and analysis routines
  • Most extensive library of filters and analysis options

The gage-capable ContourX-500 boasts unmatched Z-axis resolution and accuracy, and provides all of the industry-recognised advantages of Bruker's white light interferometry (WLI) floor-standing models in a much smaller footprint. Utilising the industry's most-advanced user interface, ContourX-500 provides intuitive access to an extensive library of pre-programmed filters and analyses. Along with its new USI universal scanning mode, the profiler is easily customised for the widest range of complex applications, from QA/QC metrology of precision machined surfaces and semiconductor processes to R&D characterisation for ophthalmics and MEMS devices.

For further information please contact us, download the datasheet, or read about the ContourX-100 or ContourX-200

ContourX-500 brochure Read more on Bruker's website