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Bruker Dektak XT Stylus Profiler

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Bruker Dektak XT Stylus Profiler

Bruker Dektak XT Stylus Profiler

The gold standard in Stylus Profilometry

Bruker NanoSurfaces


The Dektak XT stylus profiler features a revolutionary design that enables unmatched repeatability of under four angstroms of 4 and up to 40% improved scanning speeds.


This major milestone combined with its other breakthroughs, uniquely enable the DektakXT to perform critical nanometer-level film, step and surface measurements that will power future advances in the microelectronics, semiconductor, solar, high-brightness LED, medical, scientific and materials science markets.


Utilising a unique direct-drive scan stage, the DektakXT accelerates measurement scan times by 40% while maintaining industry-leading quality. Vision64, Bruker's 64-bit parallel processing operation and analysis software, enables faster loading of 3D files and faster applications of filters and multiscan database analyses.


Implementing a single-arch structure makes the DektakXT sturdier, which reduces sources of environmental noise. DektakXT's upgraded "smart electronics" reduce temperature variations and employ modern processors that minimise error-inducing noise, allowing it to be an even more robust system capable of measuring <10nm step heights.


Bruker's Vision64 software complements DektakXT's innovative design by providing the most intuitive and streamlined visual user interface. The combination of intelligent architecture and customisable automation capabilities allow for fast and comprehensive data collection and analysis. Whether you're using a recipe to perform routine analysis on single scans, or applying custom filters settings and calculations, DektakXT's Data Analyzer displays current data while also revealing other possible analyses.


For further information please contact us or download the datasheet.


    DektakXT brochure                                                        Read more on Bruker's website